Extended Data Fig. 5: Simulations for sub-nanometer spatial resolution of ptychography.
From: Lorentz electron ptychography for imaging magnetic textures beyond the diffraction limit
a–c, Phase images from iCoM and e–g, from ptychography at different doses; d, The model phase structure used to generate diffraction patterns; h, Radial distribution function of the Fourier intensity of phase images in (a), (c), (e), (g). The model structure contains varying peak distances vertically and the arrows on (d) mark two rows with the distance of 5.2 nm. Scale bar is 50 nm.
