Extended Data Fig. 2: Fabrication of GeSe samples for in-situ TEM tensile testing.
From: Reversible shuffle twinning yields anisotropic tensile superelasticity in ceramic GeSe
a-e, SEM images showing the microfabrication process of the GeSe PTP device for tensile testing. f, TEM image of a PTP device to demonstrate the applied uniaxial tensile strain on the tiny bridge by pushing the convex pillars with a diamond punch. g-i, TEM images showing the microfabrication process of the GeSe nanobridge samples for direct tensile testing. g, TEM image showing a series of GeSe nanobridges with a diamond gripper sculpted from a diamond indenter tip. h, Alignment of one tensile sample and the diamond gripper prior to straining. i, TEM image showing the formation of stripy domains in the nanobridge during strain loading. Inset is the collected load‒displacement curve during the loading of strain along the zigzag direction.
