Extended Data Fig. 4: Miscut stripes (MS)-induced electronic pattern in LSMO.
From: Moiré engineering of electronic phenomena in correlated oxides
a, AFM image of a LSMO/LAO sample showing surface steps due to miscuts on the LAO substrate. b, Corresponding near-field image obtained simultaneously with the AFM image in a, showing spatially alternating values of IR near-field signal. c, Line profiles along the dashed lines in a and b show that near-field signal is positively correlated to the topography of miscut steps.
