Fig. 2: Vector electrometry of a piezoelectric PZT film.
From: Imaging ferroelectric domains with a single-spin scanning quantum sensor
a, Out-of-plane PFM image of a patterned eight-crossed domain structure. b, NV electrometry taken over the same region with the bias magnet oriented in-plane (B⊥zNV). c, Same as b but with the bias magnet oriented out-of-plane (B∣∣zNV). d, NV electrometry maps from a patterned square domain. The two maps show orthogonal in-plane field components, obtained by shifting the magnetic angle φB by 45°. e, Corresponding simulated electric field images with schematics of the magnetic bias angle (grey) and detection axis (purple). f, Laboratory-frame vector plot of the electric field \({{{{\bf{E}}}}}^{{{{\rm{lab}}}}}=({E}_{x}^{{{{\rm{lab}}}}},{E}_{y}^{{{{\rm{lab}}}}},{E}_{z}^{{{{\rm{lab}}}}})\) reconstructed from the maps in panel d. \({E}_{x}^{{{{\rm{lab}}}}}\) and \({E}_{y}^{{{{\rm{lab}}}}}\) components are represented as arrows and \({E}_{z}^{{{{\rm{lab}}}}}\) is shown as a colour. g, Reconstructed surface charge density σ revealing the written square domain pattern. h, Corresponding out-of-plane PFM image. Dwell times are 12 s per pixel (b,c) and 10 s per pixel (d). Scale bars, 1 μm. rad., radian; Sim., simulation; arb., arbitrary units. White dashed lines outline the inner domain.
