Extended Data Fig. 2: Fluence independence of THz frequency decay dynamics.
From: A Hubbard exciton fluid in a photo-doped antiferromagnetic Mott insulator
a ΔE(tEOS, t) traces taken with tEOS fixed to the time where E(tEOS) is maximal (Methods) plotted as a function of the fluence of the α-resonant (0.6 eV) photo-excitation. Data was collected at a sample temperature of 80 K. b Decay constants extracted from an exponential fitting (Methods) of the traces in panel a. The solid line is a guide to the eye. Error bars are the standard deviation from the least-squares-fitting algorithm.
