Extended Data Fig. 5: Experimental 2D conductance versus displacement histograms.
From: Comprehensive suppression of single-molecule conductance using destructive σ-interference
a, Si4; b, Si222; c, Si2-Si222-Si2. d, Two-dimensional histogram of normalized flicker noise power against average junction conductance for Si4 along with a 2D Gaussian fit of the data. We see almost no correlation between flicker noise power and the conductance and the noise power scales as G1.1.
