Extended Data Fig. 7: Excess noise measured at zero and finite temperature difference with error bars.
From: Electronic noise due to temperature differences in atomic-scale junctions
a, b, Excess noise as a function of conductance measured in the examined molecular junctions as presented in Fig. 2a, b, including error bars, corresponding to the systematic errors in our measurements. The size of the error bars is comparable or slightly larger than the diameter of the semitransparent red symbols.
