Extended Data Fig. 8: STEM imaging and strain analysis of the PMN-PT/SRO/STO interfaces.
From: Heterogeneous integration of single-crystalline complex-oxide membranes
a, b, Cross-sectional HAADF-STEM images of the PMN-PT/SRO/STO interfaces with and without a Ni stressor layer. Clear straining at the PMN-PT/SRO interface can be seen with a Ni stressor layer, whereas the SRO/STO interface remains unstrained. c, Atomic-resolution STEM image of one of the periodic edge dislocations observed at the PMN-PT/SRO interface. d, Geometric phase analysis of the PMN-PT/SRO and SRO/STO interfaces in the x direction (2nd column), y direction (3rd column) and rotational geometry (last column) with and without the Ni stressor layer. The white arrows indicate edge dislocations. The colour scale indicates the strain fraction with reference to the SRO substrate.
