Extended Data Fig. 4: Control measurements under normal measurement conditions.
From: Performance-limiting nanoscale trap clusters at grain junctions in halide perovskites
a, XRD measurements averaged over ~30 × 30 μm2 on freshly made (Cs0.05FA0.78MA0.17)Pb(I0.83Br0.17)3 samples (black line) and samples after shipping and PEEM imaging (blue line). b, Five repeated TR-PEEM measurements (1.55-eV pump, 4.65-eV probe) on a (Cs0.05FA0.78MA0.17)PbI3 sample taken in sequence and the corresponding real time of exposure shown on the bottom x-axis. The signal is averaged over the 10-μm FOV. We see an increase of ~4% in the trap density (for example, the flat plateaus at negative time delays, represented by the dashed grey lines) over the 80 min of measurement time.
