Extended Data Fig. 3: Topography of buckled regions in the G/NbSe2 sample.
From: Evidence of flat bands and correlated states in buckled graphene superlattices
a, STM topography of a region in the buckled graphene membrane measured with different bias voltages: 500 mV (left) and 50 mV (right). b, dI/dV map over an area of size 6 nm × 6 nm in the crest region at the energy of the N = 0 PLL.
