Extended Data Fig. 1: Characterization of epitaxial thin films.
From: Antiferromagnetic half-skyrmions and bimerons at room temperature
a, HR-XRD 2θ − ω scan. The positions of the α-Fe2O3 film and α-Al2O3 substrate Bragg peaks are indicated. b, Rocking curve of the α-Fe2O3 film for the (0006) Bragg peak. c, XRR curve of the α-Fe2O3 film (black dots) and fit (red line) indicating a thickness of ~25.5 ± 0.6 nm. Doped films have similar HR-XRD, XRR scans and rocking curves. d, XAS spectra with LH- and LV-polarized X-rays, performed below the Morin transition. e, XAS spectra with LH-polarized X-rays, performed below and above the Morin transition. Spectra collected above TM result from averaging of many IP domains. f, Standard magnetic dichroism (XMLD⊥,LH−LV) obtained by subtracting the LV curve from the LH curve when T < TM (OOP spins). g, Alternative form of magnetic dichroism (XMLD||avg−⊥,LH), akin to other studies in the literature31,42. This was obtained by subtracting the LH curve collected when T < TM (OOP spins) from its counterpart when T > TM (IP spins). The absorption and dichroism results for our films are in good agreement with the α-Fe2O3 literature41,42. The energy positions (E1, E2) at which PEEM images give maximum AFM contrast are also indicated. See Supplementary Information section 1 for more details on the symmetry analysis and notations. a.u., arbitrary units.
