Extended Data Fig. 2: Characterizations of CeOx/SiO2, CeO2 NPs/SiO2 and CeO2.
From: Functional CeOx nanoglues for robust atomically dispersed catalysts
a, XRD pattern of 12 wt% CeO2 NPs/SiO2 synthesized by impregnation method. b,c, HAADF images of 12 wt% CeO2 NPs/SiO2 in separate regions. The inset to b shows a photograph of the as-synthesized CeO2 NPs/SiO2 powders. d, Size distribution of CeO2 NPs in CeO2 NPs/SiO2 from HAADF images. e,f, HAADF images of pure CeO2 powders, which were fabricated by precipitation and calcination. g, Normalized Raman spectra of the as-synthesized CeOx/SiO2 and pure CeO2. h, High-resolution HAADF images of, and intensity linescans across, a crystalline CeOx nanocluster and a CeO2 nanoparticle. i, Ce 3d XPS data obtained for the 12 wt% CeO2 NPs/SiO2. Circles and black lines represent the data and the fit, respectively. j, H2-TPR profiles obtained on the CeOx/SiO2 and pure CeO2. TCD, thermal conductivity detector. k, XRD patterns of CeOx/SiO2 support after various treatments. Treatment conditions: black, calcined in air at 600 °C for 12 h; red, reduced in H2 at 600 °C for 24 h; blue, re-calcined in air at 600 °C for 12 h after reduction; and orange, calcined in air at 800 °C for 4 h. Prolonged H2 reduction at 600 °C modified the crystallinity of the CeOx nanoclusters, whereas re-calcination at 600 °C recovered the original structure of the CeOx nanoclusters.
