Extended Data Fig. 3: Characterization of Pt/CeOx/SiO2.
From: Functional CeOx nanoglues for robust atomically dispersed catalysts
a, ICP-MS measurements of Pt concentrations in the final catalysts. b, BET surface areas of various supports and the 0.4 wt% Pt/CeOx/SiO2 catalyst. The BET surface area of the SiO2 support did not change significantly after deposition of CeOx and Pt. c, Estimate of Pt loading levels (relative to the CeOx nanoclusters) in the CeOx/SiO2. d, Estimated specific surface area of CeOx in CeOx/SiO2 and CeO2 in CeO2 NPs/SiO2, and number density of Pt atoms on CeOx (CeO2) component. e, Plots of attainable wt% Pt loading (with respect to SiO2) versus the specific surface area of SiO2 for various sizes of CeOx nanoclusters and the distance between them, assuming that each CeOx nanocluster hosts only one Pt atom. D, average size (diameter) of CeOx nanoclusters; L, average distance between the edges of CeOx nanoclusters. Experimental parameters characterizing the 0.4 wt% Pt/CeOx/SiO2 were used for the plot (red). f, Plots of attainable wt% Pt loading (with respect to SiO2) versus specific surface area of SiO2 for CeOx nanoclusters (D = 2 nm, L = 9 nm) reported in this work. N, number of Pt atoms on each CeOx nanocluster. The red, black and blue lines represent 1, 2 and 5 Pt atoms, respectively, on each CeOx nanocluster. g,h,i, XPS data characterizing the as-synthesized 0.4 wt% Pt/CeOx/SiO2 catalyst.
