Extended Data Fig. 10: Confined heterobilayer growth of TMDs (MoS2/WSe2) and their characterization.
From: Non-epitaxial single-crystal 2D material growth by geometric confinement

a–c, Raman mapping of the E12g peak on the MoS2/WSe2 heterobilayer at each trench shows that ML-MoS2 is uniformly filled up (~94%) on top of ML-WSe2 at the wafer-scale (a). For the MoS2 layer of the heterobilayer, E12g (384.9 cm−1) and A1g (403.1 cm−1) peaks appeared in the Raman spectra (b). As shown in the representative photoluminescence spectra (c), two peaks associated with direct gaps of MoS2 and WSe2 were detected, confirming the ML-MoS2 formation. A slight shift of the peak from the original direct gap occurs due to a well-known interlayer exciton coupling33. d,e, The high crystalline quality of the MoS2 was further confirmed by ideal XPS spectra observed in narrow-scan data of Mo (3d3/2 and 3d5/2; d) and S (2p1/2 and 2p3/2; e), which showed no signs of defects or atomic mixing related Mo6+ peak at ~236 eV34.