Extended Data Fig. 1: Characterization of perovskite structure and description of topotactical reduction process. | Nature

Extended Data Fig. 1: Characterization of perovskite structure and description of topotactical reduction process.

From: Critical role of hydrogen for superconductivity in nickelates

Extended Data Fig. 1

a, b, Typical RHEED intensity oscillation and RHEED pattern along SrTiO3 [101] azimuth direction for Nd0.8Sr0.2NiO3 films. The oscillations indicate that the film grows layer by layer during the initial stage of growth. The layer-by-layer growth gradually disappeared as the film thickened. c, Typical XRD of as-grown Nd0.8Sr0.2NiO3 films. Nd0.8Sr0.2NiO3 (001) and (002) diffraction peaks are located at 23.7° and 48.3°, respectively d, Illustration of the reduction heating process. During the reduction time the sample is maintained at the temperature of 300 °C.

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