Extended Data Fig. 10: Defective ice Ic growth. Growth of one defective ice Ic crystallite.
a–d, Time-lapsed TEM images of one ice Ic crystallite (top row) and corresponding selected area FFTs (bottom row). The corresponding illumination electron beam dose of each image is 47 e−/Å2. Electron irradiation time for each image is 0.4 s. Facets were indexed as labelled on images. Area I is the single crystalline Ic matrix along <110> zone axis. Area II shows the high density of stacking faults on (\(1\bar{1}1\)) plane based on diffractometry information. Both single-crystalline Ic matrix and the defected area grew over time with no phase transition during the observation time.
