Extended Data Fig. 4: Atomic-scale structural characterization by HAADF-STEM of the Nd0.7Sr0.3NiO2 film on LSAT with SrTiO3 capping layer.
From: Linear-in-temperature resistivity for optimally superconducting (Nd,Sr)NiO2
HAADF-STEM image of the Nd0.7Sr0.3NiO2 film on LSAT. Scale bar, 5 nm.
