Extended Data Fig. 4: Bend contour movement during sample tilt. | Nature

Extended Data Fig. 4: Bend contour movement during sample tilt.

From: Spin-mediated shear oscillators in a van der Waals antiferromagnet

Extended Data Fig. 4

The panels are a series of equilibrium bright-field electron micrographs at 98 K, taken from the same flake as shown in Fig. 1f at different sample holder tilt angles around the axis indicated in the top-left image (dashed line). This axis is parallel to the line connecting the (±3 ±3 1) peaks (Extended Data Fig. 3b). Coloured dots mark the bend contour movements at different spatial locations associated with peaks \((\bar{3}\,3\,1)\) (red) and \((3\,\bar{3}\,\bar{1})\) (green and blue).

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