Extended Data Fig. 9: Atomic force microscopy image and additional electrical characterization for the 15 L device. | Nature

Extended Data Fig. 9: Atomic force microscopy image and additional electrical characterization for the 15 L device.

From: Two-dimensional heavy fermions in the van der Waals metal CeSiI

Extended Data Fig. 9

a, Atomic force microscopy image of a 15 L device. b, 2D plot of the longitudinal resistance (Rxx) as a function of the temperature and applied magnetic field. c, 2D plot of the Hall resistivity (Rxy) as a function of the temperature and applied magnetic field.

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