Extended Data Fig. 9: Theoretical simulation and experimental measurements on hBN.
From: Bevel-edge epitaxy of ferroelectric rhombohedral boron nitride single crystal
a,b, Interlayer differential charge density (a) and the corresponding line profiles (b) of the exfoliated hBN flakes. c,d, AFM height mapping (c) and the corresponding KPFM mapping (d) measured on the exfoliated hBN flakes, showing no potential change of hBN with different thickness. The curve data were collected along the orange dashed lines. e, PFM measurements on exfoliated hBN flakes, showing the absence of ferroelectric responses. Inset, AFM height mapping of hBN with a typical thickness of 3.9 nm.
