Extended Data Fig. 8: Resolution analysis using FSC and edge profiles.
From: High-performance 4-nm-resolution X-ray tomography using burst ptychography
a, Fourier shell correlation (FSC) of the reconstructed tomogram showing a pixel-limited half-pitch resolution of 4.2 nm. b, Copper interconnects were used for edge profile analysis in c, which supports the half-pitch resolution estimation by FSC based on the 25-75 edge criterion.
