Extended Data Fig. 5: TEM images and SAED patterns of the 200 nm-thick NNO films.
From: Ultrahigh electromechanical response from competing ferroic orders
(a) Low magnification cross-sectional TEM images were taken along ZA \([\bar{1}\bar{1}2]\). (b) N phase and P phase boundary image. The P phase shows clear dark stripes that are perpendicular to the [001] direction compared to the N phase. These regular stripes indicate the AFE modulation of the NNO P phase. Indexed selected area electron diffraction (SAED) patterns taken along (c) ZA \([1\bar{1}0]\) and (d) ZA \([\bar{1}\bar{1}2]\). Only one set of main diffraction spots was demonstrated, suggesting that the N and P phases have very similar symmetry and lattice. The superlattice indices including half and quarter reflections indicate that there may be some modulation like oxygen octahedral rotation or atomic anti-ferroelectric arrangement in the NNO film. (e) Extracted quarter diffraction peaks from the SAED pattern. (f) Intensity profile image of figure e.
