Table 1 Summary of experimental parameters
From: Certified randomness using a trapped-ion quantum processor
Label | Meaning | Value |
|---|---|---|
n | Number of qubits | 56 |
\({\mathcal{B}}\) | Cost of simulating challenge circuits | 90 × 1018 FLOPS |
\({\mathcal{A}}\) | Sustained peak performance of the Frontier supercomputer | 0.897 × 1018 FLOPS |
– | Time to simulate challenge circuits on the Frontier supercomputer | 100.3 s |
χ | Threshold for XEB test | 0.3 |
tthreshold | Threshold for average time per sample | 2.2 s |
Tb,cutoff | Cutoff time for the server to respond to a batch of 2b circuits | 2.5 × 2b s |
M | Number of successful samples | 30,010 |
tQC | Average response time per successful quantum sample | 2.154 s |
m | Number of samples used to measure XEB | 1,522 |
XEBtest | Measured XEB | 0.32 |
