Extended Data Fig. 6: Imaging the tip touching area.
From: Quantum twisting microscopy of phonons in twisted bilayer graphene
a, Schematic of the QTM tip scanning spatially over atomic defects in WSe2. The tunnelling current increases when the tip overlaps the defect, generating an image of the shape and area of the tip. b, Real-space images of the graphene tips (tip contact area is shaded in blue). d.c. bias during scanning was −1 V for tip 1 and −1.2 V for tip 2.
