Extended Data Fig. 1: Domain contrast image obtained by DF TEM analysis.

a, SAED pattern obtained from TTG. The first-order Bragg peak (\(g=10\bar{1}0\)) is marked with the black dashed circle and the three sets of second-order Bragg peaks, \(g=\bar{1}2\bar{1}0\), \(g=11\bar{2}0\) and \(g=2\bar{1}\bar{1}0\), are marked with red, blue and green dashed circles, respectively. A grey dashed line is drawn to denote the tilt axis. b, A series of DF TEM images obtained as a function of specimen tilt angle in the electron microscope. Four distinct domains are marked as A, B, C and D. c, Electron diffraction intensities experimentally measured from the four different domain regions as a function of tilt angle of the specimen. The red, green, black and blue curves correspond to the diffraction intensities obtained from the domains marked as A, B, C and D, respectively. The error bars represent the standard deviations of the intensities obtained from different domains with identical atomic configurations. d, Simulated electron diffraction intensities obtained from different stacking orders in trilayer graphene. The red, green, black and blue curves correspond to the simulated diffraction intensity obtained from ACB, ACA, ABA and ABC stacking orders, respectively.