Extended Data Fig. 9: Comparison of dislocation patterning among (a-c) CoNiV(SS), (d-f) CoNiV-AlTi(SS) and (g-i) CoNiV-AlTi samples deformed to 15% strain at 87 K.
From: Dual-scale chemical ordering for cryogenic properties in CoNiV-based alloys
Samples were probed based on the \({\boldsymbol{g}}=1\bar{1}1\) diffraction vector from grains with a similar orientation relative to the loading direction. Sample preparation procedures are schematically illustrated in (j). For each grain probed, the corresponding Kikuchi pattern was firstly acquired to confirm the orientation of this grain to be close to <110> direction. The presented Kikuchi patterns are taken when keeping TEM stage not tilted. The α and β values inset in each image represent the TEM stage tilt angles, which indicates the tilt angles we need to take to get the <110> zone axis. In comparison to two solid-solution treated CoNiV(SS) and CoNiV-AlTi(SS) samples, more non-planar dislocations are observed to be originated from well-developed planar-slip bands in the CoNiV-AlTi containing dual-scale ordering at this strain.
