Extended Data Fig. 7: Tolerance of dN/dS values to errors.

a) Measurement of the tolerance of RBM10 dN/dS truncating to artifactual mutations (artifacts) following the BotSeq mutational profile⁸². The boxplots represent the distribution of dN/dS values calculated from 100 synthetic samples with increasing rates of injected artifacts between 0 and 1 × 10⁻⁷ (one order of magnitude higher than estimated for the technology), and for increasing values of ground truth dN/dS (between 1 and 50). The boxplots display the quartiles with whiskers extending to the highest and lowest data points within 1.5 times the interquartile range. N = 100 synthetic samples. b) Average percentage of RBM10 dN/dS truncating reconstructed value across 100 synthetic samples, calculated by computing which fraction of the ground truth dN/dS in a sample is obtained upon calculation. c) Summary of the results of the experiment of error tolerance. Left panel, average percentage of reconstructed ground truth dN/dS across synthetic samples (for all genes and all ground truth dN/dS explored altogether) that is calculated upon injection of increasing rates (x-axis) of different types of artifacts (color legend). Center plot, average percentage of reconstructed ground truth dN/dS across synthetic samples (for all genes and all artifacts altogether) that is calculated upon injection of increasing rates (x-axis) for different values of ground truth dN/dS (color legend). Right panel, average percentage of reconstructed ground truth dN/dS across synthetic samples (for all ground truth dN/dS explored and all artifacts altogether) for different genes (color legend), that is calculated upon injection of increasing rates (x-axis) of artifacts.