Supplementary Figure 11: Simulating diffraction-limited TIRF data from instant TIRF-SIM data.
From: Single-shot super-resolution total internal reflection fluorescence microscopy
a) Synthetic object. b) The object blurred with the raw instant TIRF-SIM PSF, derived from beads (e.g. Supplementary Fig. 8d). This image represents what is captured on the camera. c) The object blurred with the diffraction-limited TIRF PSF (e.g. Supplementary Fig. 8b). This is what the camera would measure with emission micro-optics removed. d) The deconvolved instant TIRF-SIM image. e) The image that results after blurring d) with a PSF with kernel σ =(σ2DIFFRACTION-LIMITED - σ2INSTANT TIRF-SIM)0.5 where σINSTANT TIRF-SIM is derived from the deconvolved instant TIRF-SIM PSF (e.g. Supplementary Fig. 8f). Compare c) to e) – they are near identical as line plots in f) and g) (corresponding to blue and red lines in c, e) confirm.
