Supplementary Figure 5: Delining instant TIRF-SIM data.
From: Single-shot super-resolution total internal reflection fluorescence microscopy
a) Example of data from Fig. 1a. Top: before delining, bottom: after delining. b) corresponding power spectra of images in a). Top: power spectrum corresponding to the image before delining. Blue arrows highlight locations in Fourier space that correspond to horizontal line artifacts in the image. Bottom: power spectrum corresponding to the image after delining. Notch filters (black rectangular regions of zero intensity) are selectively applied, resulting in suppression of line artifacts. c), d) Additional examples from data presented in Fig. 2c and Fig. 3a, highlighting delining. Insets show higher magnification views of yellow and red rectangular regions. Scale bars: a), c) and d) 5 μm, insets 2 μm, b) 1/200 nm−1. Experiments were repeated at least 4 times with similar results; representative data are shown.
