Extended Data Fig. 6: Cross-sections in xy and yz-planes of 3D-reconstructions of tubulin (green) and noise fraction maps (magenta) for different camera exposure times.
From: Structured illumination microscopy with noise-controlled image reconstructions
a, Widefield, (b–d) state-of-the-art SIM for low, medium and high regularization, (e) true-Wiener SIM, (f) flat-noise SIM, and (g) notch-filtered SIM. The dashed lines in (a) indicate the location of the xz and xy slices. Scale bar 3 μm.
