Extended Data Fig. 7: Widefield and noise-controlled 3D-SIM reconstructions of a 100 nm bead layer sample.
From: Structured illumination microscopy with noise-controlled image reconstructions
a,b, Widefield, (c,d) true-Wiener SIM, (e,f) flat-noise SIM, (g,h) notch-filtered SIM. The white box in (c) indicates the insets (b,d,f,h). i,j, SSNR of the SIM reconstructions without (i) and with (j) notch filtering. The data is averaged over rings in Fourier space and the plot is on a logarithmic scale according to log10(1+SSNR). The red line indicates the (ring averaged) support of the SIM-OTF, the white line indicates the SSNR = 5 region in Fourier space used for the extrapolation of the true-Wiener regularization filter. k, FRC curves for SIM obtained from 4 repeated acquisitions of the bead layer sample. The FRC resolution is 106.3 ± 0.5 nm, very close to the extended SIM diffraction limit 1/(2NA/λ + 2/p) = 99 nm for the estimated pattern pitch p = 416 nm, consistent with the relatively high signal level (peak pixel intensities above 104 detected photons) and the broad support of SSNR above one in spatial frequency space. Scale bar (a,c,e,g) 3 μm, scale bar (b,d,f,h) 1 μm.
