Extended Data Fig. 4: Flat-noise SIM provides better visibility of high spatial frequency structures.
From: Structured illumination microscopy with noise-controlled image reconstructions
a–d, Widefield, true-Wiener, flat-noise, and notch-filtered SIM reconstructions of a nanofabricated test structure of lines with 140 nm pitch. The line pattern is just visible in flat-noise, and notch-filtered SIM but overshadowed by the noise pattern with uneven distribution of noise over spatial frequencies in true-Wiener SIM. Scale bar 1 μm.
