Figure 1
Domain walls in synthetic ferrimagnet nanostructures. (a) Diagram of SyF track indicating the directions of magnetisation, x-ray beam in the PEEM, electron flow (e−) during magnetotransport, applied field (H) and defined coordinate system. (b) High-resolution TEM cross-section of SyF thin film. The layers are t 1 = 13.3 nm and t 2 = 6.6 nm thick separated by a 0.7 nm thick Ru spacer layer. (c) XMCD-PEEM images and micromagnetic simulations of SyF structure with 400 nm wide track, showing reversal of ellipse and track in the thicker Co90Fe10 layer. XMCD-PEEM images are taken at remanence after application of a field pulse, with contrast sraing only from the upper, thicker layer. The color wheel indicates the magnetisation directions in the same layer in the micromagnetic simulations. (d) LTEM image of injected DW in SyF track with 800 nm width. The measured DW width is ~100 nm. The red and blue arrows indicate the inferred direction of magnetisation in the two layers.
