Figure 3 | Scientific Reports

Figure 3

From: Strain engineered pyrochlore at high pressure

Figure 3

High-pressure X-ray diffraction of Dy2Zr2O7. Representative high-pressure XRD patterns for Dy2Zr2O7 annealed at various temperatures: (a) 1500 °C, (b) 1200 °C, (c) unannealed. Miller indicies of the defect-fluorite structure are shown in (a). A transformation from defect-fluorite to cotunnite occurs at high pressure. Value on the right of each diffraction pattern is pressure in GPa.

Back to article page