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Figure 2

From: Growth of high-quality Bi2Sr2 CaCu2O8+δ whiskers and electrical properties of resulting exfoliated flakes

Figure 2

Structural characterization of BSCCO whiskers. (a) Powder x-ray diffraction pattern of BSCCO whiskers. The powder diffraction pattern shows (00l) plane as the preferred orientation, where the thickness of the whisker corresponds to c-plane. (b) HRTEM of BSCCO whiskers with incident beam parallel to c-axis. (c) Cross-sectional TEM with incident beam perpendicular to c-axis. Periodic lines at interval of 1.52 nm are visible. (d) Electron-beam diffraction with incident beam parallel to c-axis. HRTEM and electron-beam diffraction data suggest high crystalline quality of the whiskers.

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