Figure 4
From: Super-resolution Surface Microscopy of Conductors using Magnetic Resonance
(a) Simulated slice profiles using SMC with N = 4 to 52 (in steps of 4), using a single value of k = 1.65. The maximum value of the curves is normalized to allow for a direct comparison of the slice width. (b) Calculated full width at half maximum (FWHM) of the lineshapes in (a) plotted against N. The Bloch simulations were performed with Δ = 800 μs, T 1 = 170 ms, T 2 = 600 μs and τ(π-pulse) = 10 μs.
