Figure 4 | Scientific Reports

Figure 4

From: Contrast enhancement of biological nanoporous materials with zinc oxide infiltration for electron and X-ray nanoscale microscopy

Figure 4

SEM micrographs of brain tissue sample after SiS ZnO treatment and after a slice was milled off using focused ion beam. Vertical striations are artifacts from the ion beam milling procedure. (a) SEM micrograph image at 650 X. Scale bar is 50 μm. (b) SEM micrograph image at 3.5 K X. Scale bar is 10 μm. (c) SEM micrograph image of a sliced putative cell (neuron) at 20 KX. Scale bar is 2 μm. (d) Image taken at one of the smaller cavities above the putative cell (neuron) seen in (c) at 120 KX. Scale bar is 300 nm.

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