Table 1 Summary table of the photoluminescence/atomic force microscopy results obtained from the measurements carried out on the different samples under study.

From: Combined atomic force microscopy and photoluminescence imaging to select single InAs/GaAs quantum dots for quantum photonic devices

Sample

No. of QDs analyzed

AFM feature type

No. of matching AFM/QD positions

I

25

oval

7

II

21

dip

5

III

33

crater

19

IV

10

oval

6

  1. The number of QDs that have been analyzed (photoluminescence positioning, spectral characterisation, and atomic force microscopy), the type of surface features observed with the atomic force microscope (examples of “oval, “dip” and “crater” features are shown in Figs 2d, 3c (first column), 3c (second column) respectively), and the number of instances in which the stated AFM surface feature type was observed in proximity to the QD’s emitting dipole are shown.
Back to article page