Figure 3
Total electron yield γ as a function of target temperature for 3.2 MeV and 4.0 MeV Xe17+ ions impacting on SiC ceramics in normal incident case.
Figure 3 | Scientific Reports
Total electron yield γ as a function of target temperature for 3.2 MeV and 4.0 MeV Xe17+ ions impacting on SiC ceramics in normal incident case.
