Figure 1
From: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk
(a) Longitudinal (L) and transverse (T) 5–10 μm-thin slices of silk embedded in epoxy were used for FT-IR micro-spectroscopic characterisation. Cross-polarised optical image of the sliced silk fiber obtained with a waveplate (λ) shifter. Sample preparation: silk fiber was aligned and epoxy embedded, microtome sliced for L and T directions. (b) SEM image of a single laser pulse melted silk; laser wavelength 515 nm, pulse duration 230 fs, focused with objective lens with numerical aperture NA = 0.5, pulse energy 85 nJ, linear polarisation was along the fiber (marked by arrow).
