Figure 5
From: Orientational Mapping Augmented Sub-Wavelength Hyper-Spectral Imaging of Silk
High resolution 1.9 μm ATR FT-IR maps at 1.9 μm resolution of the longitudinal (L) cross sections of silk presented in auto-scale for better viewing; a background-corrected absorbance is ranging from 0 to approximately 0.2. Lateral step size between pixels was 0.5 μm; as-measured pixelated absorbance maps are presented. Polarisation of incident light onto ATR prism was s (in the plane of image; along y-axis).
