Figure 2

(a) Transmission electron microscopy (TEM) images of Ni₂P/C, (b) high-angle annular dark field (HAADF, left) image and corresponding elemental mappings (C, Ni, and P) of Ni₂P/C using energy dispersive X-ray spectroscopy (EDS), and (c) X-ray diffraction (XRD) pattern of Ni₂P/C (purple line: JCPDS 03-0953).