Figure 2 | Scientific Reports

Figure 2

From: Single-shot structural analysis by high-energy X-ray diffraction using an ultrashort all-optical source

Figure 2

Raw X-ray diffraction signal. The figure shows the X-ray diffraction signal from the (220) Laue reflection of a bent Ge crystal, summed over consecutive 87 shots. The crystal spectral dispersion direction is horizontal. The top edge of the detector chip was blocked by the spectrometer entrance window, which is shown by the white dotted line. The signal above this line is indicative of the background. On the lower right a small part of the undispersed direct beam that is transmitted through a pinhole in the entrance window can be seen.

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