Table 1 Rise times (τrise) were measured from the time required for each TA signal to grow from 10% to 90%; errors for τrise were obtained from the deviation in several TA datasets from the same sample.

From: Fabrication-Method-Dependent Excited State Dynamics in CH3NH3PbI3 Perovskite Films

Perovskite fabricated by

Excitation fluence [μJ cm−2]

τrise [ps]

τ1 [ps]

τ2 [ps]

CHP

16.8

1.3 ± 0.02

96 ± 3 (43%)

724 ± 31 (57%)

58.8

1.6 ± 0.04

73 ± 2 (51%)

597 ± 23 (49%)

CBdrp

16.8

1.2 ± 0.04

96 ± 6 (25%)

876 ± 38 (75%)

58.8

2.5 ± 0.04

85 ± 2 (39%)

648 ± 10 (61%)

IFF

16.8

1.2 ± 0.03

130 ± 22 (21%)

861 ± 71 (79%)

58.8

2.5 ± 0.03

84 ± 5 (36%)

625 ± 25 (64%)

  1. The decay time constants (τ1, τ2) were determined by bi-exponential decay fits (ΔT/T(t) = A 1exp(−t/τ1) + A 2exp(−t/τ2)). The numbers in round brackets indicate relative amplitudes of A 1 and A 2 in percentages. Errors for τ1 and τ2 indicate the deviation between the TA decays and the fitting function.
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