Figure 3
From: Additive manufacturing of magnetic shielding and ultra-high vacuum flange for cold atom sensors
Comparison of the results from XRD tests on the unprocessed permalloy-80 powder and the sample produced with ED = 4.9 J/mm2 along the XY and YZ-plane, respectively. The z axis is defined as the vertical axis of the sample. Each peak represents the intensity of the detected regions with the same crystallographic orientation. Although both phases are almost equally distributed on the YZ-plane, the (200) orientation dominates in the XY plane.
