Figure 4

(a) iDPC- and (b) ADF-STEM images of GaN in [\(10\bar{1}1\)] orientation. Both images are CTF corrected using (1) and high pass filtered such that the large scale variatons are suppressed (same parameters as in Fig. 3). The FOV is 3.1 nm. (c) Normalized intensity profile plots of iDPC- (solid line) and ADF-STEM (dashed line) along the indicated red dashed lines. The green dots indicate the position and expected intensity (based on numerical simulations) of the Ga columns, the solid blue dots correspond to the N columns and expected intensity in the iDPC signal, the open blue dots correspond to the expected intensity of the ADF-STEM image.