Figure 2 | Scientific Reports

Figure 2

From: Temperature, Crystalline Phase and Influence of Substrate Properties in Intense Pulsed Light Sintering of Copper Sulfide Nanoparticle Thin Films

Figure 2

Representative film temperature evolution with different pulse duty cycle and number of pulses and at (a) fluence E1 (b) fluence E4. (c) Maximum film temperature averaged over at least three measurements for varying IPL pulse fluence, number of pulses and duty cycle. Zero pulses and duty cycle represent the unsintered film. Standard deviation in peak temperature measurement was 10–15%. (d) Representative example of temperature evolution and temperature turning point during IPL of Ag NPs3.

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