Figure 7 | Scientific Reports

Figure 7

From: Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films

Figure 7

Clustering Model Fitting: Weibull plot of VSET data at four different locations where bipolar switching was successfully demonstrated. The lines represent the clustering model best fit. Here, FSET refers to the cumulative density function of the SET voltage and αC is the fitted value of the clustering factor for each data plot. The symbol WSET is the corresponding Weibit values for FSET.

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