Figure 4
From: Large anisotropy of ferroelectric and pyroelectric properties in heteroepitaxial oxide layers
(a–b) Ferroelectric hysteresis loops (Polarization versus electric field by PUND method) of the PZT epitaxial layers measured at various stabilized temperatures from 80 K to 300 K (a) along the out-of-plane (OOP) direction, and (b) along the in-plane (IP) 〈100〉 direction. (c) Variation of the corresponding remnant polarization as a function of temperature. (d) Summary of the remnant polarization and the pyroelectric coefficient measured both along the OOP and IP directions.
