Figure 6 | Scientific Reports

Figure 6

From: A transmission electron microscope study of Néel skyrmion magnetic textures in multilayer thin film systems with large interfacial chiral interaction

Figure 6

DPC images taken at (a) low and (b) high magnification from the 10× ML film tilted at 45° to the electron beam. The tilt axis is shown in (a) together with the mapping direction of the magnetic induction. A linetrace taken from the red box area in (b) is shown in (c) averaged over 5 lines showing the deflection (integrated induction) profile allowing measurement of domain wall width. Also shown in red is the profile obtained from the MuMax3 simulation, see supplementary information.

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